Precision laser process
- Pulse duration
- Pulse energy/fluence
- Repetition rate
- Polarization
- Wavelength
- Aggregated set of parameters with unique process strategy for sub-micron level precision processing
- Non-thermal metal/polymer/glass patterning and cutting
- Precision filter / masking devices
- fs Laser : Cold ablation by ultrashort pulse duration
- Mask projection : Finely controlled beam shaping
- Unique process : Theraml effect management process
Semiconductor laser annealing
- Appropriate wavelength selection for various layers
- Optimum process strategy
- Optimum optics configuration
- Proper monitoring tools
- Activation anneal after implantation
- Void Removal within DRAM’s trench Structure
- Silicidation
- Crystallization
- Complete melting by suitable laser is a fine solution for void removal of trench structure
- Selection of wavelength and process parameters, successful process achieved
- Dopant activation by laser would be needed when device dimension gets finer
- Fine activation result achieved by selection of wavelength and process parameters
- Amount of dopant diffusion is negligible compared to conventional RTA process
- Diffusion ~ <5nm
- Activation without dopant diffusion
- Surface roughness ~ bare Si